Replaced by IEC 62526 Ed. 1 (2007-11. Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.
- Standard Committee
- C/TT - Test Technology
- Status
- Inactive-Reserved Standard
- PAR Approval
- 1999-06-26
- Superseded by
- 1450.1-2025
- Board Approval
- 2005-06-09
- History
-
- ANSI Approved:
- 2005-11-17
- Published:
- 2005-09-30
- Reaffirmed:
- 2011-06-16
- Inactivated Date:
- 2022-03-24
Additional Resources
- Erratas
- 1450.1-2005_errata.pdf
Working Group Details
- Society
- IEEE Computer Society
- Standard Committee
- C/TT - Test Technology
- Working Group
-
ADMIN_8220 - Project Administration_8220
- IEEE Program Manager
- Tom Thompson
Contact Tom Thompson
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1450.1-2025
IEEE Approved Draft Standard for Extensions to Standard Test Interface Language (STIL) (IEEE Std 1450-1999) for Semiconductor Design Environments
Standard Test Interface Language (STIL) provides an interface between digital test generation tools and test equipment. Extensions to the test interface language (contained in this standard) are defined that (1) facilitate the use of the language in the design environment and (2) facilitate the use of the language for large designs encompassing subdesigns with reusable patterns.
These standards have been replaced with a revised version of the standard, or by a compilation of the original active standard and all its existing amendments, corrigenda, and errata.
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